Effect of Annealing Temperature and Film Thickness on the Optical properties of CuInSe2Thin Films

Abstract

The researcher prepared CuInSe2 thin films by conventional evaporation method under vacuum . And he also prepared films at different film thickness and different annealing temperatures. X-ray diffraction indicates that the prepared bulk and films both were polycrystalline line with tetragonal phase. The study conducted at different annealing temperatures and different film thicknesses on the optical properties of CuInSe2 thin films. The Optical constants (the attenuation coefficient and the refractive index of the films and their dependence on the annealing temperature and film thickness show Direct and indirect transition. Markedly change occurred in the energy gap due to transition detected in the prepared films that was around 1eV.No with the variation of the films.